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TMI BlogAmendments in Customs dutyX X X X Extracts X X X X X X X X Extracts X X X X ..... mitted; (ii) after serial number 64 and the entries relating thereto, the following serial number and entries shall be inserted, namely:- (1) (2) (3) (4) (5) (6) "64A. 27.04 Metallurgical coke when imported by a manufacturer of pig iron or steel using a blast furnace 5% - 7 " ; (iii) after serial number 245 and the entries relating thereto, the following serial number and entries shall be inserted, namely:- (1) (2) (3) (4) (5) (6) "245A. 84, 85 or 90 Machinery or equipment specified in List 18A, required for textile industry 5% Nil -" ; (iv) against serial number 246, in column (3), for the word and figures "List 18", the words, figures and letter "List 18 or List 18A" shall be substituted; (v) after serial nu ..... X X X X Extracts X X X X X X X X Extracts X X X X ..... ) (5) (6) "315. 87.11 Motor cycles (including mopeds) and cycles fitted with an auxiliary motor, with or without side cars, and side cars, new, which have not been registered anywhere prior to importation,- (a) if imported as Completely Built-up units (CBU) Explanation.- "Completely Built-up unit" means completely assembled vehicle, whether or not fitted with tyres or batteries. (b) if imported in any other form 60% 35% - - - -"; (ix) after serial number 321 and the entries relating thereto, the following serial number and entries shall be inserted, namely:- (1) (2) (3) (4) (5) (6) "321A. 89.01 All goods (excluding vessels and other floating structures as are imported for breaking up) Nil Nil 70"; (x) against se ..... X X X X Extracts X X X X X X X X Extracts X X X X ..... trophotometer for measuring Epitaxy Thickness, Boron and Phosphorus weight percentage (26) Parts of FTIR instrument (27) Interferometer and nano-scan meter for measuring deposited metal or oxide thickness (28) Ellipsometer for measurement of refractive thickness, thickness of layers deposited on semi-conductor wafer (29) De-Oxo purifiers and puridriers for Hydrogen, Nitrogen, Oxygen and Argon gases (30) Hydrogen, Oxygen and Nitrogen gas generators and accessories for producing high purity process gases for semiconductor wafer/device manufacture (31) Automatic lead frame loaders for semiconductor devices (32) Mercury probing apparatus and accessories for measuring oxide purity and carrier concentration of semiconductor wafers (33) Pa ..... X X X X Extracts X X X X X X X X Extracts X X X X ..... me for semiconductor devices (51) Contact Printer for photomask (52) Die sheer Tester (53) XRP Tester for inspection of the Moulded / Encapsulated devices for finding out the defects (54) Trace Moisture Analyzer / Dew point analyzer for measuring moisture contents in PPMS (55) UV light intensity measurement apparatus in semiconductor manufacture (56) Critical Dimension measurement system for Mask making". (T.R.RUSTAGI) Joint Secretary to the Government of India F.No. B-9/4 /2001-TRU Note.- The principal notification was published in the Gazette of India, Extraordinary, vide notification No. 17/2001-Customs, dated the 1st March, 2001 [G.S.R. 116 (E), dated the 1st March, 2001] and was last amended by notification No. 43/2001 - Cust ..... X X X X Extracts X X X X X X X X Extracts X X X X
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