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Prescribes duty on specified capital goods for the electronics industry - 077/89 - Customs -TariffExtract Prescribes duty on specified capital goods for the electronics industry Notification No. 77/89-Cus. Dated 1-3-1989 In exercise of the powers conferred by sub-section (1) of section 25 of the Customs Act, 1962 (52 of 1962), the Central Government, being satisfied that it is necessary in the public interest so to do, exempts the goods specified in the Table below and falling within Chapter 84, Chapter 85 or Chapter 90 of the First Schedule to the Customs Tariff Act, 1975 (51 of 1975), and are used in the electronic industry, when imported into India, from - (a) so much of that portion of the duty of customs leviable thereon which is specified in the said First Schedule, as is in excess of the amount calculated at the rate of 40 per cent ad valorem ; and (b) the whole of the additional duty leviable thereon under section 3 of the second mentioned Act. TABLE Sl. No. Description of goods (1) (2) 1. AC/DC standards/sources 2. Angle lapper for revealing junction in semiconductor manufacture 3. Artificial ears/artificial mastoids 4. Automatic Vacuum coater, evaporator including Electron beam evaporation systems/sputtering unit, heat aided coater for depositing various metal films, metal oxides film and photoresist films 5. Automatic capacitance voltage measurement equipment, junction profiler for semiconductor manufacture 6. Automatic contact welding or bonding machine for semiconductor manufacture 7. Automatic epoxy resin inject or filler/encapsulating equipment/microdispensing equipment 8. Automatic frequency plating system or automatic vacuum coater for frequency adjustment for piezo electric crystals 9. Automatic grid hole checking machine for PCB 10. Automatic head tinning machine/automatic end tinning machine 11. Automatic lapping controller 12. Automatic lead soldering machine for loudspeaker/loudspeaker components 13. Automatic lead welding machine with programmed lead assembly stations and automatic solder adopter stations 14. Automatic machine for assembling cover to potentiometer tracks 15. Automatic machine for inserting lead screw into potentiometer housing for potentiometer 16. Automatic paper tube cutting machine for loudspeaker/loud speaker components 17. Automatic paper tube making machine for loudspeaker/loud speaker components 18. Automatic plating systems (all types) for electronic components 19. Automatic resistance value performing machine by helix cutting 20. Automatic resistor bodies sorting machine 21. Automatic rider block assembling machine for cermet variable resistors 22. Automatic rimbanding machine for electron tubes 23. Automatic solder dipping machine 24. Automatic spider forming and cutting machine for loudspeaker/ loudspeaker components 25. Automatic stitcher or automatic winder or a combination thereof for Electrolytic Capacitors 26. Automatic welding machine for termination of plastic film capacitors (metallised and foil types) 27. Automatic wire cutting and stripping machine, with or without welding attachment 28. Automatic/Semi-automatic carbon track and terminal assembly machine for potentiometer 29. Bare-board continuity tester for PCB 30. Bevelling equipment or automatic contour generator for manufacture of piezo-electric crystals 31. Carbon and/or metal or resistive composition/cermet track writing/coating machine 32. Ceramic element punching machine for ceramic capacitors/cera mic substrates 33. Cold chamber minus 30 degree centigrade and below 34. Colour analyser or white balance checker or white balance tester 35. Colour purity meter 36. Crystal growth equipment for growing semiconductor single crystal 37. Decade resistance standards or decade capacitance standards 38. Die bonders or wire bonders or a combination thereof for semi conductor manufacture 39. Diffusion furnace for semiconductor manufacture 40. Distortion measurement control unit 41. Electron microscope 42. Epitaxial reactors or chemical vapour deposition equipment or combination thereof 43. Exhaust equipment (pumping system) for electron tube manufac ture 44. Field strength meter/field level meter/selective level meter 45. Floppy disk jacket folding machine 46. Floppy disk punching machine 47. Flux meter 48. Focus checker 49. Forced air or inert atmospheric hydrogen or vacuum baking/sin tering oven for electronic components 50. Gap interface and head profiling process equipment, complete with accessories for manufacture of magnetic heads 51. Heterodyne voltmeter 52. Hook pull tester with accessories for semiconductors 53. Hub-ring applicator for floppy disks 54. Hysterisis loop tracer for manufacture of ferrites 55. Ion implantation machine for doping semiconductor 56. Jacket Lamination machine for floppy disks 57. Laser trimmers/laser trimming systems with handlers, tools and accessories or any combination thereof 58. Leakage tester for hermetically sealed film capacitors 59. Machine for rotation of potentiometer shaft during testing 60. Metalisation plant or metal spraying equipment for plastic film capacitors/metallised plastic film for capacitors 61. Metallurgical microscope for semiconductor manufacture (magnification equal to or grater than 400) 62. Micro soldering unit (hot gas) for semiconductor manufacture 63. Monitor for plated thickness or vapour deposited thickness 64. Network analysers 65. Noise generators 66. Noise measuring and/or noise analysing equipment 67. Octave filter with or without amplifier and/or recorder attach ments 68. Optical inspection station for in process inspection of semiconductor chips, devices and lead frames 69. Oscilloscope calibration system 70. Oxygen monitor to measure oxygen in gases used in the semi conductor device manufacture with sensitivity 500 ppm or better 71. Particle counter for monitoring dust count in clean rooms for electronic components 72. Peel strength tester 73. Phase delay unit 74. Phase meter 75. Photo repeaters with associated environmental chamber 76. Plasma deposition system 77. Plasma etching machine or wafer etching machine or a combina tion thereof, for dry or spray etching of silicon wafers 78. Plasma welder 79. Playback or erase or record and playback test station complete with accessories for magnetic heads 80. Porosity Tester 81. Pre-leadering machine 82. Printed circuit board post soldering-lead trimming machine 83. Profile thermocouples and temperature measurement equipment for electronic component industry 84. Projection welding equipment for semiconductors 85. Puridriers for semiconductor manufacture 86. Quartz crystal slicing machine 87. Resistivity type measuring and/or sorting equipment for silicon wafers/semiconductor manufacture 88. Roll mill or nipple roll mill for manufacture of potentiometers 89. Rotary/Oscillating furnace for ferrites 90. Sealant dispensing unit for manufacture of potentiometers 91. Semiautomatic and automatic terminal/pin forming and/or assembling machine for potentiometers 92. Semiconductor lead frame/header handling equipment/ attachments including those for use with bonders 93. Signal generator or source above 1GHz 94. Silicon/Quartz crystal/wafer lapping or grinding or polishing or abrading or edge profiling machine or any combination thereof 95. Sinad meter 96. Solvent coating equipment used for final sealing of potentiometer and hybrid micro-circuit packages 97. Spin driers/rinser driers/scrubbing machine/reribbing machine for PCBs 98. Stacking or aligning or glueing machine for electronic component manufacture 99. Step and repeat cameras 100. Stereozoom microscope 101. Stroboscope 102. Temperature test system or oscillator test system for manufacture of piezo etetric crystals 103. Tension keters (upto 1 Kg.) or bond pull testers (upto 1 kg.) 104. Testing and measuring instruments for loudspeakers consisting of one or more of the following : (a) Level chart recorder (b) High quality calibrated condenser microphone with stand (c) Sine random generator (d) Gating system (e) Response test unit (f) Spectrum analyser (g) Hetradyne analyser with associated filter 105. Thermal wire stripping equipment 106. Thickness tester for measuring the dried print thicknessof cermet prints used in the manufacture of potentiometers and hybrid micro-circuits 107. Third harmonic tester 108. Torque gauges or meters (not exceeding 250 gms-cms) 109. UV intensity meter 110. Ultra sonic/Thermal sealing system for floppy diskettes 111. Vacuum measuring equipment for sealed off tubes 112. Vectroscope 113. Vibration testing machine with auto frequency changes 114. Video test signal tester 115. Viscosity meter 116. Wafer inspection equipment (including wafer probers and testers) or wafer mask inspection equipment (including wafer probers and testers) or any combination thereof 117. Wafer processing, or wafer masking equipment or a combination thereof with one or more of the following functions : (i) Photoresist coating (ii) Spinning (iii) Exposure (iv) Alignment (v) Baking and (vi) Development 118. Wafer scriber or wafer slicer or wafer sawing machine or wafer fracturer of any combination thereof 119. Watch crystal quality factor tester 120. Wave form monitor 121. Wow and flutter calibrators 122. X-Ray geniometer or piezo geniometer
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